Some random tests.
Arb pulse tests is small part of tests for analyze Arb functions, later some more about its frequancy responses etc more detailed things.
ARB 16834ns cycle. Starting of ARB, first 128ns pulse.
SDG5082 set for 16834ns cycle time.
(Oscilloscope used here is SDS1102CML, oscilloscope input terminated with 50ohm feed thru, before feed thru there is also 10dB 50ohm attenuator (Suhner) and some adapters becouse I do not have so much things with BNC, nearly all stuffs are N or SMA)
SDG output level adjusted then for around vertical 6 division display.
ARB cycle time changed 16384, 8192, 4096, 2048, 1024 and 512ns
Of course then pulse wide change proportinally 128ns, 64, 32, 16, 8 and 4ns.
Note that waveform generator sampling speed period is 2ns (500MSa/s)
Scope persistence infinite.
Same ARB as before. (16384/128ns)
Cycle time now 2000ns. (500kHz)
Same ARB as before
Cycle time now 2001ns.
Now there can see bistable jitter. Just 2ns becouse sampling interval is 2ns and it need adjust for "average" freq /cycle time.
100kHz triangle. Duty "zero".
100kHz triagle (dyty "zero") rising edge.
Pulse risetime and also fall time (both separately of course) can adjust with fine steps.
(note that falling edge have moved some amount becouse trigger position is not precisely right point when I adjust edge risetime)
It can produce fast pulses with fast risetimes also if there is used very low frequencies. Here 12ns to 60ns pulses and frequency 20Hz. And it really can adjust with 1ns steps even with these low frequencies! Also it keep risetime.
Edges and pulse width adjusting resolution is down to 100ps.
Siglent name these new features as EasyPulse:
"SDG5000 adopts Siglent original technology EasyPulse, not only enhance the hardware index but also improve the software. It can output high quality, high flexible pulse signal: 100ps low jitter, ultra wide duty-factor range: 0.0001% ~ 99.9999%, quick rising/falling edge 6ns ~ 6s, edge and pulse width precision can be adjusted: 100ps resolution.SDG5000 can meet different application situations."
But this 100ps low jitter is better to read as "down to 100ps"
I will later analyze better this jitter. Also I'm not interest about "rms" jitter as long as this value is proofed with some unknown method. Time jitter is difficult case.
One approach is measure long time maximum peak to peak jitter over one cycle.
But these numbers are not nice.
Many manufacturers tell "rms" value for jitter (and perhaps just from 1SD).
Very simple and nothing real or related to this equipment, example. It there is 9998 samples zero jitter and then one -10ns and then one +10ns. What is now rms jitter. In my some circuit rms jitter is not meaningful but these peak values may really do bad things and even kill peoples.
And now this is difficult. Example I do not have any equipment what can take exactly 10000 samples sequentially (every cycle example) and analyze this distribution.
I understand well why manufacturers, example Agilent, argumenting for rms values. It is nice to write specifications with nice looking numbers but more important is that most of users can not proof if equipment do not meet advertisements or specifications.
Attached also (just change .txt to .csv if want use it) used for this Arb tests. (both channel give same result with this same 16k csv.)
(Ch2 have also 500k but not yest tested, just only played some funs)