OK,
here are my brief quantitative T.C. measurements:
50M: 9.965M @ 24.0°C; 10.503M @ 32.4°C => 0.64 %/°C (I = 20nA)
5M: 1.0003M @ 24.0°C; 1.0061M @ 32.3°C => 0.07 %/°C (I=200nA)
500k: 99.97k @ 25.6°C; 100.04k @ 32.2°C => 0.01 %/°C (I= 1.37 .. 2.2µA)
You know what?
No usual resistor technology, even at 10M, has a T.C. of 6400 ppm/K, you get these components easily at < 200ppm/K, in Thick Film technology.
And that change correlates with the range..
Therefore, this enormous change over temperature in 50M range, and 1/10 of that in 5M range, is caused by a (parasitic) change of the measuring current, that would be about 130pA/°C for both, and that makes sense, if it is a change of bias currents, like caused by the HY3131's amplifier, CMOS MUX, or protection circuitry.
If you select DCV, 50mV range, and leave the input open, you'll get a reading of about 1.700mV, which means that the HY3131 has about 170pA bias current..which also should be strongly dependent on temperature (not tested yet).. but it's in the same ballpark.
Don't know, if the BM869 is better in that aspect, but I assume so, because that uses a higher test current (100nA) in the 50M range.
The 10V DC range is practically not affected by this temperature change, maybe < 2 counts, which implies < 3 ppm/K
Frank