V2/Lite/V2Plus4 use one measure channel and switch for Reference/Reflect/Thru. On crystal measures this of course affects, but setting a larger delay does not solve the problem.
Reduce measures RBW (set device AVG or E0/E1 registers) allow get correct results (but use external sotware AVG not reduce RBW and not allow get it) i think need show/select measure RBW value (not AVG as now)
I still struggle to understand what happed in
Joe's V2Plus4 measurements.
How did the V2Plus4 achieve the 4-fold repetition of the filter shape at about +/- 4kHz and +/- 2kHz offset?
Do you have an idea why exactly this happens, or is it simply a bug?
(Do you happen to know the IF frequency of the V2Plus4? I wonder if the ~N*2kHz offsets are possibly related to it.)
Does the same repetition effect also happen with the Lite if RBW is not reduced? (my guess were, it does not - but I may be wrong)
0x44 = 2 get only S21.
But is reflection still measured then?
My understanding is that reflection is also required for the error correction of S21, if Enhanced Reponse calibration is used.
If reflection measurement is skipped, then these S21 readings were limited to simple response normalization calibration, right?