Author Topic: Memory - die pictures  (Read 8331 times)

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Offline RoGeorge

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Re: Memory - die pictures
« Reply #25 on: May 19, 2024, 11:37:11 am »
If it is so, then yo got yourself a 4 Megapixel UV camera.  Cool!  8)
Should also work as a 4MP X-ray camera.  :scared:

First, program all the EEPROM with zero's, then expose it to X-rays for a while, then read back the memory.  X-rays energy is above the UV light, so the exposing time won't be that slow as when erasing the cells with UV.  Too bad the EPROMs do not have some "service/debug" mode to allow analog reading of each cell instead of just 0/1.  That would have turned any big enough EPROM into a high resolution X-ray film, but in silicon and reusable a few times.  :D

Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #26 on: May 19, 2024, 11:42:25 am »
That's an interesting idea. Indeed, Black&White should work.  :-+

But you will need some good quartz lenses.  :-/O
« Last Edit: May 19, 2024, 12:11:09 pm by Noopy »
 

Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #27 on: July 15, 2024, 03:22:29 am »


The FM28V100 is an FRAM with the same specifications as the FM24V10 (https://www.richis-lab.de/RAM01.htm). The only difference is the parallel interface of the FM28V100. It has 16 address inputs and an 8-bit wide data interface. The FM24V10, on the other hand, is available with an SPI or I2C interface.






Apparently, the FM28V100 uses the same design as the FM24V10. This could already be surmised, as the die has many more bondpads than are used in the FM24V10.

However, the design of the die is not completely identical. The FM28V100 has an additional metal layer, but this is only filled with a dummy structure.




Dummy structures are usually added so that the layers can be processed as evenly as possible. If layers are very inhomogeneous, it can happen, for example, that a grinding process has not yet removed enough material at one point, while at another point it has already penetrated too deep into the structures. In this case, however, the top metal layer is not utilised at all. It was not present at all in FM24V10. It remains unclear what purpose the dummy structures fulfil.




Apart from the dummy structure, there is no superficial difference between the FM28V100 and the FM24V10. However, there is a small update in the top right-hand corner. This shows the year 2016, while the FM24V10 shows the year 2008.


https://www.richis-lab.de/ROM09.htm

 :-/O
 
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Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #28 on: August 02, 2024, 03:49:41 am »


I have some more pictures showing details of the U2164!
The 64kBit DRAM U2164 shown here was manufactured in March 1988 at the "Zentrum für Mikroelektronik Dresden". A lot of background information about the U2164 can be found in the documentation of the Tesla MHB4164, which also contains a U2164: https://www.richis-lab.de/RAM02.htm




As with the Tesla MHB4164, the dimensions of the die are 7,0mm x 3,4mm.
This image is also available in a higher resolution: https://www.richis-lab.de/images/RAM/07x02XL.jpg (36MB)




On the left edge is the designation and the number 5, which most likely refers to the revision of the design.




The structures can be recognised a little better in this picture. Due to the high density, the area of the memory cells still remains unclear.






The carrier on which the die is located is visible on the side of the package. The voltage generated by the integrated charge pump can be measured there. On another U2164 (date code March 1989) this voltage is -1,7V. The potential is applied to the substrate via the carrier and thus optimises the threshold of the integrated transistors.




Each of the eight memory blocks in the U2164 has a reserve row and two reserve columns. This increases the yield considerably, as it is possible to switch to these reserve areas in the event of production errors in the memory. Switching takes place via an area on the right-hand edge of the die. There are 32 and 36 fuses located there. To trigger the fuses, the area is obviously supplied via three testpads.




Large transistors can be seen above the fuses, which allow the trigger current to flow. The necessary fuses are apparently selected via the addressing interface. The area of the fuses looks a little unclean because the passivation layer has been omitted in this area. This is necessary so that triggering a fuse leads to a safe interruption of the connection. It also ensures that triggering does not cause major damage to the surrounding passivation layer.

How the addresses are redirected to the reserve areas remains unclear. Usually the address decoding is changed for this purpose. Modifying the addressing does not allow completely arbitrary replacement of memory cells, but it is often sufficient to hide all defective cells.


https://www.richis-lab.de/RAM07.htm

 :-/O
 
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Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #29 on: August 05, 2024, 02:49:06 pm »


The U2164 shown here was manufactured in April 1987.




The large die requires a lot of space in the DIL-16 package.




On the die you can see some dirt and artefacts. This picture is also available in a higher resolution: https://www.richis-lab.de/images/RAM/08x02XL.jpg (48MB)




The die is coated with a protective layer, which partly explains the dirt. Particles usually adhere very strongly to such protective layers. However, a not inconsiderable proportion of the contamination must have already been on the die before the package was opened.

Coatings are not primarily used to protect memory modules from contamination, but rather to shield them from radioactive radiation. This means that alpha particles from the housing material cannot affect the memory cells.




There is a dark spot on the upper edge of the die, under which one would suspect an electrical defect. However, it only appears to be soiling in the potting material.




The die marking documents that this is the fourth revision of the U2164. The Tesla MHB4164 (April 1990) and the previously documented U2164 (March 1988) are labelled revision 5, which means that between April 1987 and March 1988 the revision was changed from revision 4 to revision 5.




It can be seen that revision 5 of the U2164, measuring 7,1mm x 3,4mm, is significantly smaller than the revision 4 used here, which measures 8,2mm x 3,8mm. Such a significant reduction in surface area cannot be achieved with minor optimisations. All structures were apparently reduced in size for revision 5. However, the functional blocks appear to have the same electrical structure apart from minor details.




The protective layer somewhat disturbs the view on the structures. However, the capacitors that store the data can now be recognised in the memory area.




The details of the structures show that the memory is not built exactly as described in Radio Fernsehen Elektronik 08/1989. When analysing the U2164 in the Tesla MHB4164 (https://www.richis-lab.de/RAM02.htm), it had to be assumed that the documentation depicted reality exactly. The mode of operation is shown correctly, but the superimposition of the structures has been simplified. The very dense arrangement in the memory array means that the word lines are not only routed over the areas where they are building the selection transistors. They also lie on the areas that represent the capacities.

At first glance, it appears that this additional overlay could have an undesirable effect on the memory cells. The image of the cross-section provides clarity. The storage capacities arise between the substrate and the first polysilicon layer, whereby the first polysilicon layer represents the reference potential. If there is a line in the second polysilicon layer above this first polysilicon layer, this has no relevant influence on the storage capacity.




A major change has been made in the area of the charge pump, which sinks the substrate to a negative potential. The same circuit parts can be recognised, but in revision 5 (below) a lot has been omitted.

Apparently, this area was not only used to generate the negative substrate voltage. In revision 5, a line leads to various elements in the left part of the die. In revision 4, the beginning of this line is present, but it leads to an open end.




The circuit section for switching to reserve areas is constructed in the same way in revision 4 as in revision 5. The recesses in the passivation layer are even more clearly recognisable here. No fuse was triggered. The memory appears to have been faultless.




This component is defective. Without adressing, it draws more than 100mA. An infrared camera with a macro lens makes it possible to identify the area with the greatest heat development. This is not necessarily the location of the fault. The heat development can be a subsequent reaction. However, such an image can help to identify faults.




If the thermal image is superimposed, it becomes clear that the greatest heat development occurs in the area of the first bondpad. However, no obvious damage can be recognised in this area.





Here you can see another U2164 in a ceramic case. It was produced at the same time as the upper U2164.






The protective coating appears even more soiled here than in the first U2164. This picture is also available in a higher resolution: https://www.richis-lab.de/images/RAM/09x03XL.jpg (47MB)




Here, too, a small area of the protective coating is very dark.




This U2164 was obviously not perfect. Here you can see some triggered fuses.


https://www.richis-lab.de/RAM08.htm

 :-/O
 
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Offline iMo

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Re: Memory - die pictures
« Reply #30 on: August 05, 2024, 03:12:33 pm »
Afaik those TESLA MHB4116, MHB4164 and later on MHB41256 (not sure the 256k one went into full production though) were produced in the famous spa town Piestany (Slovakia today) on a production equipment purchased and nmos/cmos technology licensed from Toshiba, 4um and perhaps 1um or 2um at the end of its existence (starting memory production from early 80ties till early 90ties)..
« Last Edit: August 11, 2024, 07:33:14 am by iMo »
 

Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #31 on: August 05, 2024, 03:56:06 pm »
It seems that at least for some time the MHB4164 was a U2164 and was packaged in Erfurt.

The geometries are typical for Erfurt.

https://www.richis-lab.de/RAM02.htm

Offline iMo

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Re: Memory - die pictures
« Reply #32 on: August 05, 2024, 04:04:12 pm »
Yep, it is possible, in the time of east european Comecon they were packaging chips cross border happily. Sometimes the chips from the west as well..
 

Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #33 on: August 05, 2024, 04:11:19 pm »
Well cooperation makes sense. Other projects were less reasonable:
The DDR and the SU both independently made a copy of the MicroVAX II CPU.  ;D

Offline iMo

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Re: Memory - die pictures
« Reply #34 on: August 05, 2024, 05:05:22 pm »
Btw. - a less known company Everspin sent me some 10+y back a 4Mbit MRAM sample (I think the MR20H40, but I cannot find it in my junk box anymore). Would be interesting to see that chip too - as that technology is quite mysterious..  :o
« Last Edit: August 05, 2024, 05:07:00 pm by iMo »
 

Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #35 on: August 05, 2024, 07:21:57 pm »
I have heard of these MRAM devices. Unfortunately I´m pretty sure you can´t see very much in a 4Mbit device. But if you want me to take a closer look...  ;) ;D

Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #36 on: August 08, 2024, 04:03:42 am »


A small update for the U2164: Here you can see the dummy cells that are used to read the memory cells.


https://www.richis-lab.de/RAM07.htm#Dummy

 :-/O
 
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Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #37 on: August 11, 2024, 04:48:03 am »


The 256kBit DRAM U61256 was developed at the Zentrum für Mikroelektronik in Dresden. It was the largest mass-produced RAM in the GDR. The subsequent 1MBit memory U61000 was only produced in a small series. The characters XN indicate production in November 1989.

The numbers 10 stand for the first selection type, which allowed access times of 100ns. This was followed by selection type 08, which was specified with 80ns. The basic type (12) offers access times of 120ns, the slowest bin (15) has an access time of 150ns.






The datasheet shows the structure and function of the U61256. 8 bits of the 9-bit wide addressing interface are first decoded for row selection and then for column selection. The memory consists of two 128kBit areas which output the information of four cells simultaneously when reading data. The ninth bit of the addressing interface, which is also evaluated twice, controls the selection of one of these four cells. The data output in the top right-hand corner is missing in the block diagram.




The size of the die is 9,6mm x 3,8mm. Each supply potentials is routed to the die with two bondwires.




The image of this is also available in a higher resolution: https://www.richis-lab.de/images/RAM/10x03XL.jpg (67MB)








Here you can see another U61256. The bin marking is missing on this component. XO indicates production in October 1989.

The image of this part is also available in a higher resolution: https://www.richis-lab.de/images/RAM/11x03XL.jpg (71MB)








The third U61256 appears to come from the same batch as the second.

The image of this part is also available in a higher resolution: https://www.richis-lab.de/images/RAM/12x03XL.jpg (71MB)




All three dies are labelled U61256-1. The number 1 probably indicates the first revision of the design. Fittingly, I can´t see a difference in the three parts.




The left-hand edge appears to have had some imperfections during production. The third part shows soiling or signs of corrosion that extend to the first active structures.




On the upper edge you can see some masks.




The metal layer appears to have penetrated from the contacts into the polysilicon layer in many areas. The effect can be found in all three parts. The section shown here is from the third part.




The memory cells are too small and there are too many layers on top of each other to be able to clearly recognise the structure. The surface structure of the metal layer appears to show capacitor geometries similar to those in the U2164.

As in the U2164, line selection in the U61256 also takes place laterally and data evaluation is placed at the lower or upper edge of the storage areas. In contrast to the U2164, however, the lines in the metal layer run horizontally rather than vertically.




The memory area only has line drivers on the right-hand side. Correspondingly large driver transistors are integrated there in order to be able to represent the necessary charging current. This could also be an explanation for the horizontal lines in the metal layer. The metal layer has a lower impedance than the polysilicon layer.




In the block diagram, the memory area is divided into two parts. The upper and lower blocks each consist of two areas. Each of these areas contains 15 segments, from each of which 64 lines lead out of the area. There are 32 lines at the beginning and 32 at the end. This results in a total of 256.000 memory cells. There are 16 additional columns on the right-hand edge. Apparently, the memory has 16 reserve columns, i.e. 8.192 additional memory cells, to compensate for production errors.




Here you can see the structures that run through the two large storage areas. The supply lines are relatively massive. Perhaps they are used to preload the columns before the memory cells are read.




Even if the exact structures of the column selection cannot be recognised, some functions can be surmised. Two times eight lines run horizontally between the two large memory blocks. These are most probably the address lines for the two memory blocks. Four lines run somewhat shielded from this in the centre, which then certainly transmit the four memory contents readout.

The fact that the 16 columns on the right are the reserve columns can also be seen here (red arrows). The first four blocks, which read out four columns each, are constructed and contacted differently. Five additional control lines are routed to this area.




The circuit that enables the reserve columns to be looped into the address range is integrated on the right-hand edge. There are two times 36 fuses near the edge of the die for this purpose. The triggering is apparently similar to that of the U2164. Two testpads are integrated, one of which transmits the triggering current.




The triggered fuses can be easily recognised. The fuses are thin polysilicon strips. Some fuses were triggered in all three parts. Apparently there were defective cells in all three parts.




The bias voltage generation is located in the top right-hand corner of the die, which places the substrate at a negative potential. In the upper area, the circuit contacts the frame structure. This potential is also used in some parts of the circuit.

In addition to the two testpads for triggering the fuses, there are two further testpads on the die. It is interesting to note that the surface of these testpads has a different structure. It could be that two types of testpads were used depending on the application. The testpads of the fuses are always contacted during production. The bias voltage probably only rarely needs to be measured. This testpad is also significantly smaller. The function of the fourth testpad remains unclear. Although its surface is structured in the same way as the bias voltage generation testpad, it was contacted for all three components.




Here you can see an input protection circuit. It probably works in a similar way to the input protection circuit in the U2164. The two long, green elements are resistors for current limitation. In the upper area, two elements are surrounded by strips that are connected to the ground potential. The first element is probably a diode. The second element is a grounded gate NMOS.




The push-pull output stage of the data output is very easy to recognise.


https://www.richis-lab.de/RAM09.htm

 :-/O
 
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Offline iMo

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Re: Memory - die pictures
« Reply #38 on: August 11, 2024, 07:35:53 am »
Quote
This results in a total of 256.000 memory cells. There are 16 additional columns on the right-hand edge. Apparently, the memory has 16 reserve columns, i.e. 8.192 additional memory cells, to compensate for production errors.
I wonder what was the typical yield at that time in the Dresden fab?

PS: @Noopy: a high time to acquire an electron beam microscope (as a minimum) :)

TSMC starts construction on its first European chip plant in Dresden, Germany, marking a $10 billion investment to boost the semiconductor industry.

Quote
..The ground-breaking ceremony, scheduled for August 20, 2024, will initiate a project expected to be operational by late 2027. The facility will focus on producing 28nm, 22nm, and 16/12nm nodes, critical for various applications from automotive to industrial equipment​.

https://manufacturing-today.com/news/tsmc-commences-10-billion-semiconductor-plant-project-in-germany/

« Last Edit: August 11, 2024, 08:25:05 am by iMo »
 

Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #39 on: August 11, 2024, 08:01:05 am »
Quote
This results in a total of 256.000 memory cells. There are 16 additional columns on the right-hand edge. Apparently, the memory has 16 reserve columns, i.e. 8.192 additional memory cells, to compensate for production errors.
I wonder what was the typical yield at that time in the Dresden fab?

You don´t find very much information about the U61256. The situation is much better for the U2164 and the U61000.
The U2164 yield was increased starting from 6% in 1987 to 50% in 1988. It is said that there was a cooparation with Toshiba which helped a lot. (Kampfauftrag
Mikrochip, Olaf Klenke)

It seems >10% was considered as not bad.  ;D


PS: @Noopy: a high time to acquire an electron beam microscope (as a minimum) :)

I don´t want to own one myself I just would love to have unlimited access to one.  ;D
« Last Edit: August 11, 2024, 08:03:22 am by Noopy »
 
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Offline magic

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Re: Memory - die pictures
« Reply #40 on: August 11, 2024, 09:28:02 am »
You can still go further with optical, I think 1980s technology should be within reach.

In order to at least pretend that I'm staying on topic, below is a memory array (probably SRAM because there was another, larger one which would be the program memory) of an unknown low cost MCU from tenx technology which I extracted from a bicycle speed meter made in mid 2000s. I included bond pads for size reference, these are almost always 100×100 micron on all chips. Image scale is 200nm/px, determined by dividing measured overall die size by pixel count.

This image was assembled from many smaller frames and not all of them were in perfect focus, but you can see that pretty fine details are resolvable with an ordinary 40x0.65 objective. DoF becomes a serious pain, though, and focusing on the low layers tends to blur the upper metal somewhat. You could still get twice the resolution by employing oil immersion, but there is no way the results would be usable without focus stacking.
 
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Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #41 on: August 11, 2024, 10:44:21 am »
A lot is possible with the right equipment and some automation. It helps a lot if you have some knowledge in optics and programming. This french guy here produces some really nice pictures including "interactive" focus stacking: https://ic.onidev.fr/en/die/multifocus_panoramas.html
 
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Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #42 on: August 20, 2024, 03:39:29 am »


The NMC27C64 is a UV-EPROM built by National Semiconductor. The device offers a memory depth of 8kB.




The block diagram in the datasheet shows the structure of the EPROM.




The dimensions of the die are 2,9mm x 3,2mm. The individual function blocks are easy to recognise. The output stages of the data interface are located on the right-hand edge. The address signals are analysed between the other bondpads. The memory area has 256 columns and 256 rows. The column is selected at the bottom edge. The eight addressed memory cells are selected and analysed at the right-hand edge of the memory. The memory cells are also written to via the circuit on the right-hand edge.

This image is also available in a higher resolution: https://www.richis-lab.de/images/ROM/10x03XL.jpg (36MB)




The top edge shows that the design dates back to 1985.




The E after the designation could stand for a fifth revision of the design. National Semiconductor often used letters at the end of the type designation as revision counters.

The second line shows the revisions of the masks used. The revisions of the masks are usually reset when the complete design is upgraded to a new revision. Seven masks appear to have been used. The datasheet states that the process provides two polysilicon layers. This matches the visual appearance of the structures on the die.




In addition to the National Semiconductor logo, some structures show the optical performance of the process. The small squares could be etch markers that allow the progress of the individual processes to be assessed during manufacture.




The lines leading into the memory area can just be recognised. The structures of the memory cells themselves are concealed by the metal layer.


https://www.richis-lab.de/ROM10.htm

 :-/O
 
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Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #43 on: September 20, 2024, 03:02:32 am »


The U61000 is a 1MBit DRAM developed at the Zentrum für Mikroelektronik Dresden. It was never transferred to mass production. The so-called megabit chip has achieved a certain fame as it was one of the last prestige projects of the GDR semiconductor industry. Much of the following information comes from people who were involved in the development of the chip, including the project manager Prof. Dr. Bernd Junghans, the chief developer Dr. Jens Knobloch, the head of technology development Dr. Michael Raab, the director of research and development Prof. Dr. Dieter Landgraf-Dietz, the division manager Jörg Ludewig and Dr. Hans Becker, who did his doctorate in the field of the U61000.

The unusually large lid of the package is immediately noticeable. It covers almost the entire surface. The characters A2 show that the part was produced in February 1990. The 12 on the left-hand side indicates the slowest bin with an access time of 120ns. According to the datasheet, one faster bin was planned.




This diagram was taken from the study "Der Osten Deutschlands - ein Standort europäischer Elektronik-Industrie" written by Prof. Dr. Wolfgang Marschall. It shows the technological backwardness of the GDR semiconductor industry in an international comparison.




The table above, taken from the article "Die “technologische Lücke” - zum Rückstand der mikroelektronischen Industrie der DDR" published in 1998 in issue 25 of "Dresdener Beiträge zur Geschichte der Technikwissenschaften", is even clearer. According to the article, series production of the one-megabit chip in the GDR did not begin until five years after the international market launch. In addition to the technological backlog, the high development costs and the comparatively low quantities also meant that electronic components from own development and production were very expensive. Nevertheless, their own developments were necessary and sensible for the GDR, as integrated circuits were often on embargo lists and valuable foreign currency had to be sacrificed. At the same time, many different ICs were urgently needed for consumer goods, industry and, of course, the military.

If new processes are developed in the semiconductor industry that enable smaller structure widths, they are usually used to produce memory first. Memory has relatively simple, constantly repeating structures. It was therefore only logical for the GDR to further develop their memory technology. The process used in the U61000 is called CSGT5d: Complementary Silicon Gate Technology, technology level 5. The letter d probably indicates a variant of this process. In the publication "Looking back: Artwork and Mask Making in Dresden for the East German Megabit Chip Project" by Hans W. Becker, it is stated that "about 16" masks were used. Michael Raab, Head of Technology Development, also spoke of 16 masks (and 6 implantation steps) at the 19th Leibniz Conference in his lecture "Technologie der Mikroelektronik der Schlüssel für die digitale Revolution". In 1989, the journal "Mikroprozessortechnik" published a large article by Dr. Jens Knobloch with a little more detail. According to this article, three polysilicon layers and one metal layer were used to connect the 2,3 million components. A total of 430 sub-steps were necessary to produce the U61000. This article mentions 18 photolithographic structuring steps.

Of course, third-party samples were also analysed for the development of the U61000. The TC511000 from Toshiba was particularly important in this context. Siemens produced similar chips and had acquired a licence for them from Toshiba. The GDR's foreign intelligence service had even obtained documents on this megabit chip. However, it was not possible to build the U61000 on this basis, as it was necessary to work with the technologies and materials that were available. The basic architecture and functional blocks may have been inspired, but it was not possible to simply copy the Western product.

The Soviet Union was able to produce 256kBit memory before the GDR. However, when the GDR was able to hand over a 1MBit memory to the Soviet Union, unique parts of its own megabit memories were only available there. Moreover, these were not yet based on the more modern CMOS technology. However, the GDR used some specialised technical equipment from Western production, while the Soviet Union relied solely on its own production facilities (Source: Wafer stepper and megabit chip by Otto Bernd Kirchner).




According to Wikipedia, the U61000 was planned for use in the Robotron computers K1820, K1840 and EC1835, among others. Here you can see the K1822 workstation. This is a replica of the MicroVAX II from DEC. The corresponding MSC20 memory module is shown on the right. With 72 U61000, the plug-in card offers 8MB of memory.




The table above shows the different revisions of the U61000, some core specifications and who published the information. Before the better-known versions, there was the U61000T, which was later renamed U61000-0. This was the first draft of the megabit memory, which was finalised in December 1987. The first chips were available in April 1988, although they still contained bit errors.

With the knowledge gained from the U61000-0, the design of the U61000-1 was finalised in May 1988. This made it possible to produce the first bit-error-free chips in August 1988. In September 1988, the first samples of the megabit chip were presented to the public. The sub-variants U61000-1.1 and U61000-1.2 were then produced from this variant. Pilot production of the U61000-1.1 began in March 1989 and the U61000-1.2 was produced from September 1989 to March 1990. A total of 6.700 components were produced.

The dimensions of the U61000-1 were 12,8mm x 5,1mm. For use in expoxy packages, it was necessary to make the die a little smaller. For this reason, the design of the U61000-2 version was finalised in January 1989. Dimensions between 12,5mm x 4,4mm and 12,6mm x 4,5mm are specified for this and the two sub-variants 2.1 and 2.2. It was particularly important to reduce the width. Previous tests had shown that the dimensions of the storage capacitors could be reduced from 3,89µm x 9,00µm to 3,24µm x 9,00µm. This was certainly very helpful in this context.

Dr. Hans Becker states a yield of 10% and 20% respectively for the last two versions 2.1 and 2.2. According to various sources, the total number of U61000s produced must have been around 30.000.




The 19th Leibniz Conference included the presentation "Entwicklung des Megabitspeichers U61000 1986 bis 1990" by Dr. Jens Knobloch. It contains the table above, which shows the characteristic values of the pilot production. The targeted specifications were achieved and in some cases significantly exceeded. The yield was 9,5% and the necessary reliability was also demonstrated.




Inside the package, you can see how borderline large the die of the U61000 is. It is also noticeable that there is no thick protective layer on the silicon, as can be found on the U2164 (https://www.richis-lab.de/RAM08.htm), for example. Such layers are often used in memories to shield alpha radiation. The package materials are never completely free of radioactive elements, whose radiation can lead to bit flipping. A certain degree of robustness against ionising radiation is achieved through the structure and arrangement of the storage cells. Dr. Jens Knobloch also describes in the article "Der Megabitspeicher U61000" in the journal Mikroprozessortechnik (issue 10, 1989) that potential barriers were incorporated into the U61000 under the memory capacitors and under the bit lines to reduce the effects of ionising radiation.




The lecture "Speicherchip-Packaging - die Technologielokomotive für das Back-end" by Jörg Ludewig is also part of the 19th Leibniz Conference. It includes a technical drawing of the package. The package had to be imported and was correspondingly expensive. A changeover to an epoxy package had to be made as quickly as possible.

The labelling shows that the potential Ubb is contacted at both edges. Ubb is the substrate potential that is not routed to the outside, but is only connected to the metal surface on which the die is located.




The dimensions of the die are 12,8mm x 5,1mm. This corresponds to the dimensions found in the literature for the U61000-1.

The image of the die is also available in a higher resolution: https://www.richis-lab.de/images/RAM/13x04XL.jpg (28MB)




A stylised frog is depicted next to the designation U61000. The chief developer Dr. Jens Knobloch immortalised himself on his designs with this symbol.




The U61000 datasheet shows the memory interfaces. The ten address lines are used to first select the row and then the column of the memory.




The above block diagram can be found in the aforementioned article "Der Megabitspeicher U61000". Four 256kB blocks form the core of the memory. Each block has 512 lines. The line decoders each activate one line. Four times 512 sensor amplifiers analyse the four times 512 columns and then write the data back again. The column decoder selects one cell from each block. One of the four cells is then analysed for the output. As will be shown later, this representation does not quite correspond to reality.

For addressing, the ten address bits are stored once in the row address buffer and once in the column address buffer. The U61000 also contains a refresh control with an address counter. This function block makes it easier to update all data in the memory fast enough.




The potentials of the pins are easily found on the die (cyan). As can be seen in the drawing of the package, there is a bondpad on the left and one on the right that carry the substrate potential (orange). There are two unused bondpads on the upper edge. Another unused bondpad is located at the bottom edge (white). The signals of all three bondpads end in stubs. However, the structures contain provisions to connect the bondpads with the address potentials A0, A8 and A9. This was presumably intended to keep the option of using other package types with differently positioned contact surfaces.




The input protection circuit appears almost like a work of art. To a large extent, it corresponds to the protection circuit described in more detail in the U2164 (https://www.richis-lab.de/RAM02.htm). Here, an additional transistor has been integrated close to the bondpad, which uses a metal strip as a gate electrode. This transistor only becomes conductive at exceptionally high voltages and then creates a low-resistance connection to the reference potential.




The die has a large number of testpads. These include 27 large testpads (red), which could also be contacted automatically. 82 significantly smaller testpads (yellow) allow internal signals to be contacted for more in-depth tests without having to modify the structures of the chip.




The large testpads often contact test structures, but not exclusively. The small testpads are mainly used as taps for internal signals.




The structure widths and the many layers make it difficult to analyse the circuit components precisely. However, the recognisable structures and the connections make it possible to understand how the circuit works in many places.

The large structures of the charge pump, which ensures a negative substrate potential, can be found in the upper right-hand area of the die. One might think that the upper area represents the associated clock generator. However, the clock generator actually appears to be located in the lower area of the die. This leaves open what function the upper circuit fulfils. Perhaps it is an adjustment/modification of the clock signal.




Here you can see the circuit at the bottom right of the die, which most likely contains the clock generator. The larger, upper part of the image contains large structures that could represent the resistors and capacitors required for a clock generator. The small, repeating structures could be the associated transistors. At the upper end of the image, four wider lines lead to the right, which appear to be clock lines.

The clock lines lead to the charge pump, among other things. However, the U61000 also requires a clock signal in other areas. Obviously, this is the address counter for regularly updating the data. However, the clock is also routed to the memory blocks. For this purpose, there is a circuit in each of the two right-hand corners of the die that looks like a driver. Here you can see one of the two circuits at the bottom of the picture.




The structure of the storage area cannot be recognised. The structures would still be large enough to resolve them optically. However, the many layers, which carry many lines in this area, create an unevenness in the surface that makes the image very confusing.

The word line (line selection, vertical) was mapped in the aluminium layer. The relatively low-resistance metal allows for long cables. The bit lines (column selection, horizontal) could be made shorter as a result. This is advantageous as it results in lower parasitic capacitances, which makes it easier to analyse the voltages, which are only slightly above 100 mV.




The image above is from the article "Der Megabitspeicher U61000" by Dr. Jens Knobloch. The four wiring layers ensure that the top view remains unclear even in the stylised representation. The cross-section is somewhat easier to understand. The first and lowest polysilicon layer forms the storage capacities with the n-doped areas in the substrate. The potentials of the word lines, which are distributed via the metal layer, reach the gate electrodes of the selection transistors via contact windows, which cannot be seen in the cross-section. The gate electrodes are structured with the second polysilicon layer. This is surprising at first glance. Normally, the highest demands are placed on the gate oxide of the transistors. One would therefore expect the gate electrodes to be manufactured first. In a DRAM, however, the storage capacity is more critical, which was probably the reason for producing it with the first polysilicon layer. The bit lines are located in the third, top polysilicon layer. As with the U2164, it contacts a point between two memory cells (https://www.richis-lab.de/RAM02.htm).




Prof. Dr. Bernd Junghans and Dr. Michael Raab published the article "CSGT5 - eine moderne Basistechnologie fuer Hoechstintegration" in the magazine Jenaer Rundschau in 1989. It contains the stylised structure above and the SEM image of a polished section below. You can immediately recognise the irregular surface, which makes it difficult to resolve the structures optically.

The top image in particular shows more clearly where which areas are located and how they are structured. The substrate is coloured dark green at the bottom. The orange layer contains the doping, which results in conductive structures in the substrate and between which MOS transistors are created with a gate electrode. The black shaded material is the silicon oxide that serves to insulate the conductive areas. The first polysilicon layer is shown in dark brown. As described above, it represents the storage capacity. The second polysilicon layer in dark blue on the right is the gate electrode of the selection transistor. The left-hand strip has no function in this image. It merely leads to the next, shifted memory cell and forms the gate electrode of the selection transistor there. The third polysilicon layer is shown here in more detail. The image description explains that it is molybdenum silicide, which is located on a polysilicon base. The metal layer is coloured yellow.




As the structure widths are reduced, the resistances of the conductor paths and contacts between the layers become increasingly critical. For this reason, western megabit memories use titanium. Titanium reacts with silicon to form titanium silicide, which offers significantly reduced resistance. The GDR did not have titanium with a sufficiently high purity (99,9999%). It would have taken at least 5 years to produce such pure titanium. As an alternative, high-purity molybdenum could be used, which is also well suited to reducing the resistance of silicon. However, the structures produced with this material behaved differently. This was one reason why the known structures of western megabit memories could not simply be adopted.

The picture above is from the lecture "Entwicklung des Megabitspeichers U61000 1986 bis 1990" by Dr. Jens Knobloch. It shows the result of an element analysis on a section of the U61000. The substrate and the polysilicon lines consist mainly of silicon, which is shown in blue. The insulating silicon oxide is shown in red. The metal lines are green. The yellow-coloured molybdenum is clearly visible in the horizontal bit line.




There is another very interesting article in the Jenaer Rundschau from 1989: "Entwurf des Megabitspeichers" by Dr. Jens Knobloch, Prof. Dr. Wolf-Joachim Fischer, Stephan Dobritz and Andreas Scade. It documents, among other things, the reduction of structure sizes in the area of DRAMs with the image above. For the publication on this page, only the arrangement of the components has been slightly modified and the designations added. In some cases, only the functional areas of a structure have been coloured. This must be taken into account in order to understand the illustrations. The red areas represent the memory capacities. The selection transistor is located in the area coloured blue. Contact windows are coloured green. The metal layer is grey. A slightly darker blue colour has been chosen for the trench structure of the 4MBit DRAM.

The U256, a 16kBit DRAM, has a completely different structure to all subsequent memory technologies. The structure of the memory cells in the 64kBit DRAM U2164 has already been documented in detail (https://www.richis-lab.de/RAM02.htm). The coloured illustration of the U61000 cell is easy to understand with the above basics. For the U61256 (https://www.richis-lab.de/RAM09.htm), the illustration does not appear to be quite correct. According to this, the bit and word lines would be shown in the metal layer and would cross each other. However, as the U61256 only has one metal layer, this is not possible. Judging by the pictures of the U61256, the bit line is in the polysilicon layer. This would also fit in with the fact that the U61256 is often mentioned as an important step towards the U61000. The selection transistor of the U61256 is also shown too large.

The U61000 was to be the last DRAM with flat memory capacitors. The 4 MBit DRAMs already available internationally had already been converted to three-dimensional capacitors. A constant reduction in the size of the memory cells reduces the memory capacities in the first instance. This can be counteracted to a certain extent by increasing the capacitance density. For example, the dielectric in the U61000 is just 10nm thick. Nevertheless, the development is problematic. The leakage current does not decrease in the same proportion as the capacitance, so that the holding time of the information is continually reduced. The parasitic capacities in the evaluation path also become increasingly critical with smaller memory capacities. The memory capacity of the U2164 is still 50fF. No information can be found for the U61000, but for the 4MBit memory the aim was to achieve 40fF. As can be seen above, a trench capacitance was planned for this, i.e. a depression that increases the capacitance of the capacitor surface.




The diagram shown here is also taken from the article: "Entwurf des Megabitspeichers". There you can see how the area of a memory cell has been reduced over the generations. The two revisions of the 64kBit DRAM U2164 have already been documented (https://www.richis-lab.de/RAM08.htm). As already described, it was possible to significantly reduce the memory cell area in the U61000 from version 1 to version 2. The 4MBit memory should again result in a very significant reduction in area requirements.


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Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #44 on: September 20, 2024, 03:03:51 am »


As shown in the block diagram, the memory is divided into four 256kbit blocks. The division is not self-evident and cannot be chosen arbitrarily. You have to find an architecture that makes as much sense as possible under the many physical conditions.




The four 256kB blocks are each divided into two halves of 128kB. It seems to make the most sense to continue to display the die in the orientation shown here. However, you have to accept that the rows will be vertical and the columns horizontal. You can recognise 256(+2) rows and 1024(+4) columns. As with the U2164, the memory cells are offset from each other, so that there are effectively 512(+2) columns.

In addition to the 1MBit memory cells, the U61000 also has 1,2% reserve cells. Each half of the 256kB blocks has two additional rows and two additional columns. If faulty cells occur, their addresses can be redirected to the reserve cells within certain limits.




The line selection takes place in two stages. Six differential signal lines run along the lower edges of all four memory blocks (cyan). The signal lines are controlled by the line address registers of the address lines A2 to A7. In addition, the address lines A0 and A1 are analysed by small circuit blocks that generate four additional local control signals for each memory block (red). A value in the address space A0-A7 thus activates one of the 256 lines in each half of the memory block. The value of address line A8 also defines whether the 256kB memory block is active or not.




You can see the different contacting of the address lines in the lower area. As you would expect, the line drivers in the upper area are relatively large.




This shows more clearly that only two of the four memory blocks are active at any one time, depending on the status of address line A8. When looking at the block diagram, you might think that all four memory blocks always output a signal.

The four halves of the two active memory blocks each output the status of 512 memory cells. The parallel evaluation of all memory cells takes place in the centre of the memory blocks. From there, the 2048 binary information read out destructively must then be written back into the lines.




Column selection takes place between the memory blocks. The associated addressing is controlled by circuit sections above the memory blocks. There, the address lines A1 to A8 are analysed and fed differentially to the column selection (cyan). It is noticeable that the driver stages of six address lines have the same structure, while the other three driver stages are visually somewhat out of line. The drivers probably control different selection mechanisms. Due to the preselection via addresses A1 to A8, each half of the memory block supplies the states of two memory cells. Based on the address line A0, a further selection is made so that each memory block ultimately outputs two data signals (red). Writing takes place via the same path.

Both in the row selection at the lower edge of the die and in the column selection at the upper edge, circuit parts are integrated that are only connected to the address line A8 (yellow). In both cases, this is the signal A8 of the row selection. Lines lead from these circuit components to the outer edges of the memory blocks. Obviously, the memory blocks are also kept inactive at these points if they do not belong to the two memory blocks that are to be read or written. The address line A9 is also read in at the upper edge. It appears to have an influence on the entire column selection.




The circuit for selecting columns and for data processing is rather confusing. However, you can guess the addressing in the centre. The paired evaluation of the columns becomes clear towards the memory areas.




Each of the four 256kB memory blocks ultimately supplies two values. The outputs of two neighbouring memory blocks are combined. This is possible because only two memory blocks are ever active, controlled via address line A8. In the top left-hand corner of the die is the circuit section that finally selects one of the four data lines. It is controlled via the two values that are written to the column and row selection registers using address line A9.




The registers for column selection are integrated at the top edge of the die (yellow). The registers for row selection is mostly located on the right edge of the die (blue). The tabs for A0 and A9 can be found in the bottom left-hand corner. The counter function, which is used to refresh the memory cells, is integrated into the line selection register.






Classic fuses were still used for the 256kBit memory U61256 (https://www.richis-lab.de/RAM09.htm). The thin polysilicon lines were cut with a relatively high current. However, such fuses and the associated trigger circuit take up a lot of area. With a 1 MBit chip, more configuration options are required in order to achieve a sufficient yield. This can no longer be sensibly realised with classic fuses. Toshiba used a laser to cut the fuses of its megabit memories during the wafer test. No suitable laser was available in the GDR. Carl Zeiss Jena did not want to develop such a laser, as only very small quantities would have been required.

Consequently, an alternative to the configuration of the U61000 had to be found. In the end, it was decided to subject the circuit to another etching process after the wafer test. Customised processing was achieved using electron beam lithography. A photoresist was applied and selectively exposed with an electron beam. The subsequent etching process then only removed the previously selected fuses. The image above is from the lecture "Entwicklung des Megabitspeichers U61000 1986 bis 1990" by Dr. Jens Knobloch. It shows what a fuse strip configured in this way looked like.




There are four fuse strips at the bottom and top edge of the die. Each memory block is assigned one strip on the top edge and one strip on the bottom edge. The upper strip enables the configuration of the reserve columns. The lower strip configures the reserve rows.

Dr. Jens Knobloch reports that without the reserve cells, a yield of 3% could be achieved at the turn of the year 1989 / 1990. Utilising the redundancy increased the value to 10%. The U61000 documented here appears to be one of the very good memories, as none of the fuses was interrupted.




The fuse strips of the line selection are located in pairs where two memory blocks meet. They are connected to the differential control signals A2-A7 of the line selection.




The differential control signals of the address line A1 are also fed to the fuse strips from the lower area. The fuse elements are surrounded by several frames that carry different potentials. The substrate potential Ubb is located directly next to the fuse elements. This is followed by the positive supply potential Ucc. Below the Ucc frame is a control line and finally the Uss potential. When the passivation layer is opened, there is a risk of contamination being introduced into the system. It could be that the frames with their electrical fields are intended to prevent these contaminants from travelling.

The differential control lines arriving from above are connected to transistors under the outermost, wide Uss frame. If a signal is present there, a common control line (blue) is connected to the Uss potential. As these are differential signals, the control line in this configuration is always connected to the Uss potential. If fuses are disconnected, it is possible to ensure that the control line remains open at certain addresses. The circuit to the left of the fuse strip evaluates the potential of the control line.




While the fuse strip evaluates the signals from address lines A1 to A7, the following circuit (orange) is also controlled via address line A8. This means that the reserve lines are only active when the associated memory block is active. Finally, a control signal is generated that activates the two reserve lines (yellow). Another control signal activates a circuit that evaluates address line A0 (red). This switches between the two reserve lines. At the same time, the A0 evaluation of the normal line selection is deactivated (white). This ensures that the normal line selection remains deactivated for the addresses at which the reserve lines become active.




The different circuits for row selection are clearly visible in detail. The two control lines that are generated from the address line A0 lead directly from bottom to top. The control line for activating the reserve rows leads over the left side to the top area of the row selection.

The control line for activating the reserve rows also leads to the left area of the memory block. This means that the reserve rows in both halves of the memory block are always pushed the same distance into the usable address area. At the same time, switching the row pairs via the address line A0 ensures that the pairs can only be moved together. Both of these severely limit the possible applications of the reserve rows. However, more variable control would require a much more complex selection and control. A compromise had to be found here.




At the top edge, the differential signals of the address lines A1 to A8 are used to shift the reserve columns. While the reserve lines in the memory halves only had to be configured within 128 addresses, 256 addresses had to be used for column selection. This is why the address line A8 is also located under the fuse elements. Otherwise, the circuit works in a similar way to the circuit for assigning the reserve lines.




The reserve columns are located at the upper edge of the memory area. You can just about see the different controls via the thin line leading upwards under the metal layer.




In the top left corner of the die there are several circuit parts, which can be seen as groups of four identical blocks. This and the following images are rotated by 90°. The details of the circuits cannot be analyzed. Electrically, the area is connected between the four data lines of the four memory blocks and the output stages for data output. The signal at the data input is also fed here. It can be assumed that the necessary multiplexing and demultiplexing takes place in this area.






A closer look at the data output circuit reveals that four identical circuit blocks have been integrated in two symmetrical pairs. These are obviously four complete data outputs. In his article "Der Megabitspeicher U61000", Dr. Jens Knobloch mentions a 4-way test mode. It seems that the four blocks could be tested in parallel. That in itself is nothing unusual. It is surprising, however, that four output stages, including the necessary control, have actually been integrated.




If the three additional outputs are transferred to the bondpads, only two bondpads remain whose functions remain unclear (X1, X2). It is quite possible that at least one of the bondpads activates or controls a test mode.




This picture by Dr. Jens Knobloch shows a wafer that bears the structures of the U61000. These were 5" wafers on which 90 of the U61000 components could be integrated. At this stage of development, each U61000 still had a large test structure. In series production, this would have been omitted and significantly more components could have been integrated onto one wafer. Series production on 8" wafers had already started worldwide in 1990.




Here are two more pictures of U61000 wafers that Carl Zeiss Jena used for advertising purposes.




The above picture of the U61000 can be found in the magazine Mikroprozessortechnik (issue 10, 1989). There you can also see the large test structures.




The publication "Looking back: Artwork and Mask Making in Dresden for the East German Megabit Chip Project" by Hans W. Becker provides deep insights into the technology used at the time to expose the wafers. The table above and the following images were taken from this publication.

Carl Zeiss Jena made a major contribution to the development of the exposure process. For the U61000, 125mm x 125mm masks were used. The masks were made of chrome-coated glass. The structures were applied using the ZBA21 electron beam exposure system. The wafers were exposed directly using this mask and the AÜR wafer stepper. The AÜR used light with a wavelength of 436nm and could expose 25 wafers per hour.




The wafer stepper AÜR offered the option of exposing two areas of different sizes. Minimum structure widths of 1,6µm could be imaged on an area of 20mm x 20mm. The imaging performance on an area of 12mm x 12mm is sometimes specified as 1,2µm and sometimes as 1,0µm.

The image on the right shows that the area of 12mm x 12mm could not be used without restrictions on the AÜR. In the middle there is a strip that contains, among other things, structures that were needed for alignment and focusing. The division into two reduced the usable area, but was also intentional. The double placement of the design was used to identify errors on the mask by comparing the two halves. Errors could sometimes be corrected with a laser.




Here you can see the distribution of the masks on the U61000-1 on the left. They were produced in May 1988. Due to the image scale of 5:1, the masks are significantly larger than the memory. The two large gray areas are the two memory modules. Above each memory is the test chip CT5 with its many test structures. Dr. Jens Knobloch is talking about the technology test field PTF5. The mask for the active areas is shown in the right-hand image. The structures of the memory and the test areas can be clearly seen there.

The total area of the image is 12,95mm x 13,86mm and is therefore noticeably larger than the specified 12mm x 12mm of the AÜR wafer stepper. It was still possible to produce functional chips with it.




Here you can see the mask for the aluminum layer of the U61000-2.1, which was produced in February 1989. More test structures are placed on it. The total area of the image is 12,70mm x 18,00mm, but not the entire area is used for exposure. The lower test structures are only used for troubleshooting on the mask.




The image above shows the distribution of the masks for the U61000-2.2. This mask set was produced in October 1989. The middle two blocks represent the U61000 to be exposed and are shown on an area of 12,70mm x 10,30mm. The outer blocks are again only used for troubleshooting.

Since the final version lacked the large test areas, more memory modules could be placed on the 5" wafers. If one assumes that on average 120 elements fit on a wafer across the various versions and assumes an average yield of 10%, one can estimate that around 2.500 wafers of the U61000 were produced. Since this was new technological territory, one can assume that quite some test wafers were produced and discarded in parallel.




The U61000 was never mass-produced. Pilot production took place at the Zentrum für Mikroelektronik Dresden. However, the ZMD was not equipped for mass production. A separate production facility should have been set up in Erfurt for this. Before this happened, Germany was reunified. The U61000 was not even remotely competitive on the international market. The table above shows this quite clearly. It is taken from the dissertation "Wafer Stepper and Megabit Chip" by Dr. Otto Bernd Kirchner. The table documented the costs and prices of the DDR DRAM components in 1989. The world market price of a 1MBit DRAM was a factor of 100 lower than the manufacturing costs of the U61000.

The U61000 had no future after reunification. However, a product was created from the know-how generated. As is usual with storage devices, attempts were made to make the circuitry of the U61000 as insensitive to radioactive radiation as possible. After reunification, the opposite was done and the storage device was developed into a radiation sensor. This gave rise to the company Megarad. This later became the company SARAD.

In addition to the U61000, there was a U60998. There are no official documents for the U60998. Apparently, it is a U61000 with uncorrectable errors. This does not necessarily mean that the cells are completely defective. It may just be that certain specifications are not fully met in some cases. The U60998 could be used in applications where individual defective cells are less critical, for example as page memory in a printer. Apparently, U60998s have already been tested in which the full 1MBit could be written and read without errors.


https://www.richis-lab.de/RAM10.htm

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Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #45 on: September 21, 2024, 09:47:58 am »


There was a U61000-SIMM!  8)




And here you see a U60998. Unfortunately not mine...  :'(

Offline NoopyTopic starter

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Re: Memory - die pictures
« Reply #46 on: Today at 04:00:20 am »


The Intel 28F160C3TD is a Flash EEPROM in a BGA package. Intel refers to the product group as "Intel Advanced+ Boot Block Flash Memory (C3)".




The datasheet shows what the designation 28F160C3TD means. The first two letters, which are not shown on the component shown here, indicates the package variant. 28F is the abbreviation for the memory family. The numbers 160 stand for a memory depth of 16 MBit. C3 specifies the product group in more detail. The T documents where the boot area is located in the memory. This area is divided differently and functionally isolated from the rest of the memory. The letter D at the end reveals that the memory was manufactured using a 130nm process.




The datasheet also contains a block diagram of the memory.




The package contains a die measuring 5,0 mm x 1,7 mm. The evenly structured memory areas are easy to recognise. The more inhomogeneous control logic is located at the bottom right. The circuit complexity in the control logic is only slightly dependent on which of the four memory volumes have to be controlled. It can therefore be assumed that the same control block is always used. In the 8 MBit variant, the memory area is then just as large as the control logic. For the 32 MBit and 64 MBit variants, the memory areas are simply doubled accordingly.

This image is also available in a higher resolution: https://www.richis-lab.de/images/ROM/11x04XL.jpg (33MB)




In the bottom right-hand corner there is a copyright from 2002 and the designation 28F1600.




Here you can see one of the ten blocks that make up the memory area. Each of the two halves must contain 800kBit. This means that there are 12.500 individual bits under each of the 64 strips.




Shorter strips can be recognised on the sides of two blocks. These could be reserve cells that replace defective memory cells.




At the bottom edge of this you can see the smaller memory blocks in the centre, which represent the boot area.




The typical chaotic structures of logic circuits can be seen in some places in the control area. In the lower right-hand area there is a relatively small square with stripes similar to the large memory areas. This could contain special memory cells. For example, the 28F160C3TD has a 128-bit "protection register", which contains a 64-bit ID that cannot be changed. In addition, further specially protected 64 bits can be stored.


https://www.richis-lab.de/ROM11.htm

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