Hi,
If you study these graphs on the IRFP3306 MOSFET datasheet:
This curve shows that the RDSon increases as a function of junction temperature. It is normalized, to get the actual RDSon you multiple the RDSon at 25C by the coefficient on the vertical axis.
Under these conditions the RDSon has a positive temperature coefficient. This only helps sharing if the MOSFETs are being used as a switch and the gate source voltage is high enough to fully enhance the device.
In this curve, the transfer characteristics, the Drain current versus VGS is shown for two temperatures. As the temperature increases more current will flow for a given VGS. This is a positive temperature coefficient, but of transconductance. This is the curve that is applicable to an electronic load when the MOSFETs are being operated in the linear region. In the linear region there is the possibility of thermal runaway, because higher junction temperature, leads to more current, leads to a higher temperature etc.
The op-amps are cheap compared to cost of the MOSFETs. I would strongly recommend 1 op-amp per MOSFET.
I suspect that using an op-amp to servo the case temperature of the MOSFETs, as proposed by Dannyf, may work, it might also be too slow. It would be harder to implement than controlling the current in each MOSFET.
Regards,
Jay_Diddy_B