I have said before that we will get more unpleasant surprises if we test the clones now on the new CPUs in all modes.
I carefully study the customer reviews of clone models with APT32F172K8T6 and LGT8F328 chips and can add a few more differences that are characteristic of a tester based on these chips:
1.Incorrect measurement of ESR capacitors.For most serviceable electrolytic capacitors, the ESR is not defined at all or is designated as 0.00. For some types of ceramic SMD capacitors, the ESR, on the contrary, is overestimated by 10-100 times.
2.Some faulty capacitors are detected by the tester as 2 counter diodes.
3.Some BJT transistors (for example,2N5089,MPSA12,MPSA13, etc.) are defined as thyristors or resistors.
4.Some JFET transistors (e.g. J112,J113,2N5457, etc.) are not defined at all or are defined as BJT.
5. Diode assemblies with a common cathode are incorrectly determined.
I think that this is not a complete list of differences from the original project and it will be supplemented over time.