Hello,
to come back to the "position dependant drift"
https://www.eevblog.com/forum/metrology/adr1399-reference/msg4597733/#msg4597733after having added the level shifters between processor and multiplexers I added 2 LM399 to the PCB which I had in the drawer to exclude some drift by the multiplexers.
Unfortunately both LM399 (from LT) had a large initial drift.
Additionally #2 of the both LM399 had initially popcorn noise which I recognized on a first T.C. test
After some checks with constant temperature I recognized that the temperature compensation with respect to the PCB temperature (0.3 ppm/K on #4) showed some "over compensation".
So I finally measured the T.C. of ADR#01 - #04 again which was surprising to me.
The PCB temperature range with the same environment sweep has been reduced (and shifted to higher temperature) by the adittional "heaters" on the PCB.
The ADR in LS8 package do not correlate well to the PCB temperature.
But they obviously correlate good to the "environment" temperature (which is sensor glued to a heatspreader aluminium plate below the ADR1399 test PCB).
Attached a "overlay" between a old and new measurement of PCB related TC and environment related TC of ADR1399#03 which obviously driftet nearly zero since last T.C. measurement which was end of november.
So now I can explain the position dependant drift:
I relied on the PCB temperature sensor near the multiplexers to compensate for environment temperature.
Initially I had 2 degrees self heating of the multiplexers due to missing level shifters creating PCB temperature rising which does not correlate to the behaviour of the ADR1399 which react more to the environment temperature.
Also placing the ADR1399 PCB above another heat source gave a large temperature gradient between the both PCB temperature sensors of +7/-2 deg C difference.
Additional point:
We had some rather cold days where I had down to 17 deg C in my lab.
Normally the T.C. of my measurement devices (24 Bit ADCs) is temperature compensated so this should be no issue.
But with my other daily measurements I recognized that the standard deviation of my ADCs has nearly doubled from 0.25 ppm to nearly up to 0.5 ppm.
And partly some devices developed some kind of popcorn noise.
In the beginning I only evaluated one ADC (ADC#13). Now I am evaluating all 3 stable ADCs (#13, #15, #16).
comparison ADR1399 vs. LM399
- the 2 lm399 show a much larger initial ageing drift as the 4 ADR1399LS8 samples.
- The T.C. of both LM399 (TO-46) samples is lower than the 4 ADR1399LS8 samples.
lessons learned:
- the PCB temperature is not usable for temperature compensation of ADR1399LS8.
instead I should use a Metal housing and measure the temperature below the PCB.
- Never rely on one single measurement device for ageing measurements.
- Build a ageing PCB with some kind of injection channel for a proven stable reference (Like my LTZ#4 and/or LTZ#9) as sanity check.
with best regards
Andreas